Opis
Technical parameters:
Objective:
Optical position indicator Minimum detection aperture: φ5 mm Maximum detection depth: 15mm Metering force: 0.1N |
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Features:
SPTM-14B, The photoelectrical technique is adopted, with a precision grating rule as a measurer for X- and Y-axle as a measurer, with readings direct-viewing and testing convenient.
With multiple eyepieces and objectives, the main microscope has a large scope of view field with clear image formation.
The main microscope can oscillate left and right, suitable for the measurement for spiral parts.
LED-illuminating lighting is adopted for transmission and reflecting illumination, with low heating power and long life.
High-speed and micro-motion devices are adopted, which can be switched over quickly.
The tailstock rack is installed to measure the axel-type parts.
Multiple accessories are provided, with extensive uses.
Technical parameters:
Objective:
Optical position indicator Minimum detection aperture: φ5 mm Maximum detection depth: 15mm Metering force: 0.1N |
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| ID | SPTM-14B |
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